1–20 von 23 Ergebnissen
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    Microwave electron density probe.

    ABELE, M. / ATTWOOD, D. | AIAA | 1968

    EUV Lithography: An Evolutionary Path to Shorter Wavelengths and Smaller Critical Dimensions

    Attwood, D. / Zernike, F. | British Library Online Contents | 1994

    A Canadian Survey of Automobile Tire Pressures, Tire Failures, and Tire Maintenance Practices

    Attwood, Dennis A. / Williams, Raymond D. | SAE Technical Papers | 1981

    Effects of Moderate Blood Alcohol Concentrations on Closed-Course Driving Performance

    D. A. Attwood / R. D. Williams / H. D. Madill | NTIS | 1978

    Model-based vehicle detection and classification using orthographic approximations

    Sullivan, G. D. / Baker, K. D. / Worrall, A. D. et al. | British Library Online Contents | 1997

    An Investigation of the Effects of Carbon Monoxide on Humans in the Driving Task

    F. W. Weir / M. M. Mehta / T. H. Rockwell et al. | NTIS | 1973

    Our cars: Bentley Continental GT - Citroen C-Crosser - VW California

    Chilton,C. / Walton,M. / Attwood,D. et al. | Kraftfahrwesen | 2008

    Tabletop Lasers in the Extreme Ultraviolet

    Rocca, J. J. / Kapteyn, H. C. / Attwood, D. T. et al. | British Library Online Contents | 2006

    New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

    Chao, W. / Anderson, E. / Denbeaux, G. et al. | IEEE | 2003

    Experimental analysis of high-resolution soft x-ray microscopy [4499-23]

    Chao, W. / Anderson, E. H. / Denbeaux, G. et al. | British Library Conference Proceedings | 2001

    High-resolution soft x-ray microscopy [4146-24]

    Chao, W. / Anderson, E. H. / Denbeaux, G. et al. | British Library Conference Proceedings | 2000

    Recent advances in EUV phase-shifting point diffraction interferometry [3767-22]

    Naulleau, P. / Goldberg, K. A. / Lee, S. H. et al. | British Library Conference Proceedings | 1999

    Valve Wheel Rim Force Capabilities

    Attwood, D. A. / Nicholich, M. J. / Pritchard, K. K. et al. | British Library Conference Proceedings | 1999

    Soft X-ray microscopy and EUV lithography: imaging in the 20-40 nm regime

    Attwood, D. / Anderson, E. / Chao, W. et al. | IEEE | 2003

    High-resolution EUV imaging using high harmonic generation

    Libertun, A.R. / Zhang, X. / Paul, A. et al. | IEEE | 2004

    REFEREED & INVITED PAPERS - Invited paper - The role of trend analysis in the evaluation of a TravelSmart program

    Richardson, T. | Online Contents | 2006
    Beteiligte: Arblaster, D. , Attwood, D.